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An BS, Shin<sup>1</sup> YJ, Ju<sup>1</sup> JS, , Yang<sup>*</sup> CW.  Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method.  Applied Microscopy 2018;48:122-125.  https://doi.org/10.9729/AM.2018.48.4.122
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