Applied Microscopy : eISSN 2287-4445 / pISSN 2287-5123

Cited by CrossRef (10)

  1. Jennifer Rebellato, Regina Soufli, Evgueni Meltchakov, Eric M. Gullikson, Sébastien de Rossi, Cédric Baumier, Florian Pallier, Franck Delmotte. Optical, structural and aging properties of Al/Sc-based multilayers for the extreme ultraviolet. Thin Solid Films 2021;735:138873
    https://doi.org/10.1016/j.tsf.2021.138873
  2. Jorge Sanz-Mateo, Marco Deluca, Bernhard Sartory, Federica Benes, Daniel Kiener. FIB and Wedge Polishing Sample Preparation for TEM Analysis of Sol-Gel Derived Perovskite Thin Films. Ceramics 2022;5:288
    https://doi.org/10.3390/ceramics5030023
  3. Yu-Hao Deng. Sublimable materials facilitate the TEM sample preparation of oil-soluble nanomaterials. Appl. Microsc. 2020;50
    https://doi.org/10.1186/s42649-020-00042-7
  4. Juan Jesús Jiménez, Konrad Jaekel, Christoph Pauly, Christian Schäfer, Heike Bartsch, Frank Mücklich, Francisco Miguel Morales. Impact of Sample Preparation Approach on Transmission Electron Microscopy Investigation of Sputtered AlNi Multilayers Used for Reactive Soldering. Adv Eng Mater 2024
    https://doi.org/10.1002/adem.202302215
  5. S. Geiskopf, M. Stoffel, X. Devaux, E. André, C. Carteret, A. Bouché, M. Vergnat, H. Rinnert. Formation of SiP2 Nanocrystals Embedded in SiO2 from Phosphorus-Rich SiO1.5 Thin Films. J. Phys. Chem. C 2020;124:7973
    https://doi.org/10.1021/acs.jpcc.9b11416
  6. . In‐Situ Transmission Electron Microscopy Experiments. 2020.
    https://doi.org/10.1002/9783527834822.ch2
  7. Byeong-Seon An, Yeon Ju Shin, Jae-Seon Ju, Cheol-Woong Yang. Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method. AM 2018;48:122
    https://doi.org/10.9729/AM.2018.48.4.122
  8. A.J. Santos, B. Lacroix, F. Maudet, F. Paumier, S. Hurand, C. Dupeyrat, V.J. Gómez, D.L. Huffaker, T. Girardeau, R. García, F.M. Morales. Application of advanced (S)TEM methods for the study of nanostructured porous functional surfaces: A few working examples. Materials Characterization 2022;185:111741
    https://doi.org/10.1016/j.matchar.2022.111741
  9. Alexey Minenkov, Natalija Šantić, Tia Truglas, Johannes Aberl, Lada Vukušić, Moritz Brehm, Heiko Groiss. Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments. MRS Bulletin 2022;47:359
    https://doi.org/10.1557/s43577-021-00255-5
  10. Konrad Jaekel, Juan Jesús Jiménez, Sascha Sebastian Riegler, Sebastian Matthes, Marcus Glaser, Jean Pierre Bergmann, Peter Schaaf, Isabella Gallino, Francisco Miguel Morales, Jens Müller, Heike Bartsch. Influence of Additional Intermediate Thick Al Layers on the Reaction Propagation and Heat Flow of Al/Ni Reactive Multilayers. Adv Eng Mater 2024
    https://doi.org/10.1002/adem.202400522