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Park CH, Kim HL, Chang BJ, Lee SH, Chang BS, Bae CS, Cho IH, Kim DH, Han JM, Na JE, Choi BJ, Kim SS, Kim HW, Kim JW, Rhyu IJ, , Uhm CS.  Overview of Immunoelectron Microscopy.  Applied Microscopy 2018;48:87-95.  https://doi.org/10.9729/AM.2018.48.4.87