Applied Microscopy : eISSN 2287-4445 / pISSN 2287-5123

Fig. 1.

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Fig. 1. Fig. 1A indicates the energy dispersive spectroscopy line profiles used to confirm the chemical composition of the Cu(InxGax-1)Se2 layer. Fig. 1B shows the Ga/(In+Ga) ratio from the surface to the bulk region.
Applied Microscopy 2015;45:183-8
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