Applied Microscopy : eISSN 2287-4445 / pISSN 2287-5123

Fig. 4.

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Fig. 4. (A?C) Virtual bright field images from transmission electron microscopy-electron backscatter diffraction at the Cu(InxGax-1)Se2 (CIGS)/CdS interface. (D?F) Crystal orientation and inverse pole figure (IPF) maps. (G?I) Phase maps (red, CIGS; green, CdS) and the nano-beam electron diffraction patterns.
Applied Microscopy 2015;45:183-8
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