Fig. 4. (A?C) Virtual bright field images from transmission electron microscopy-electron backscatter diffraction at the Cu(In_xGa_x-1)Se₂ (CIGS)/CdS interface. (D?F) Crystal orientation and inverse pole figure (IPF) maps. (G?I) Phase maps (red, CIGS; green, CdS) and the nano-beam electron diffraction patterns.

Applied Microscopy 2015;45:183-8

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