Fig. 4. Schematic of specimen mounting for wedge-type polishing. A specimen, the reference plane of which has been polished, is mounted on the dummy transmission electron microscopy grid with an excess amount of thermal wax. The dummy grid and thermal wax protect the specimen from the risk of film delamination and cracking during polishing. Then the specimen is polished at a slight angle known as the wedge angle.

Applied Microscopy 2016;46:110-5

© 2016 Applied Microscopy