Fig. 6. Transmission electron microscopy (TEM) images of sample prepared by wedge-type polishing and low-energy ion milling. (A) Ni-SiC interface specimen. Inset is a high-resolution TEM image of Ni-SiC interface. (B) Si-selective epitaxial growth (SEG) pattern and high-resolution TEM image (inset).

Applied Microscopy 2016;46:110-5

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