Fig. 1. Schematic view of an atom probe microscope, with the specimen subjected to a high voltage (HV) and illuminated by laser pulses of HV pulses, triggering the field evaporation of ions that fly through a counter-electrode and are collected by the position-sensitive detector, which also records their time-of-flight allowing for their elemental identification. VDC, direct current high voltage; T, temperature.
Applied Microscopy 2016;46:117-26
© 2016 Applied Microscopy
