Applied Microscopy : eISSN 2287-4445 / pISSN 2287-5123

Fig. 1.

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Fig. 1. Schematic view of an atom probe microscope, with the specimen subjected to a high voltage (HV) and illuminated by laser pulses of HV pulses, triggering the field evaporation of ions that fly through a counter-electrode and are collected by the position-sensitive detector, which also records their time-of-flight allowing for their elemental identification. VDC, direct current high voltage; T, temperature.
Applied Microscopy 2016;46:117-26
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