Applied Microscopy : eISSN 2287-4445 / pISSN 2287-5123

Fig. 2.

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Fig. 2. (A) HAADF-STEM image experimentally obtained from NBT along the [001] projection and the inset image ‘c’ is a magnified HAADF-STEM image from image. Inset images ‘a’ and ‘c’ are simulated HAADF STEM images along the [001] projection from NaCl-type and criss-cross superlattices, respectively. The green, purple, gray, and orange spheres in the insets ‘a’ and ‘b’ represent Na, Bi, Ti-O, and Na-Bi atomic columns, respectively. (B) HAADF-STEM image from a thin area showing cationic disordering. (C) Intensity profi les along the [110] direction from the linear region indicated by the yellow rectangle in image (B). HAADF, high-angle annular dark-fi eld; STEM, scanning transmission electron microscopy; NBT, Na1/2Bi1/2TiO3.
Applied Microscopy 2012;42:164-73
© 2012 Applied Microscopy