Applied Microscopy : eISSN 2287-4445 / pISSN 2287-5123

Fig. 3.

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Fig. 3. Selected area electron diffraction patterns recorded along (A) <100> and (B) <110> zone axes. 1/2(ooe) and 1/2(ooo) reflections appear in <100> and <110> zone axes, respectively.
Applied Microscopy 2012;42:164-73
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