Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher
Hyun-Woo Cha, Min-Chul Kang, Keesam Shin1, and Cheol-Woong Yang*
School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon 16419, Korea, 1School of Nano and Advanced Materials Engineering, Changwon National University, Changwon 51140, Korea
Correspondence to: Yang CW, Tel: +82-31-290-7362, Fax: +82-31-290-7371, E-mail: cwyang@skku.edu
Received May 30, 2016; Revised June 23, 2016; Accepted June 23, 2016.
This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted noncommercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
- Abstract
Transmission electron microscopy (TEM) is a powerful tool for analyzing a broad range of materials and provides localized information about the microstructure. However, the analysis results are strongly influenced by the quality of the thin foil specimen. Sample preparation for TEM analysis requires considerable skill, especially when the area of interest is small or the material of interest is difficult to thin because of its high hardness and its mechanical instability when thinned. This article selectively reviews recent advances in TEM sample preparation techniques using a tripod polisher. In particular, it introduces two typical types (flat type and wedge type) of TEM sample preparation and the benefits and drawbacks of each method; finally, a method of making better samples for TEM analysis is suggested.
- Keywords : Tripod polisher, Flat-type polishing, Wedge-type polishing, Hard materials, Sample preparation
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Funding Information-
National Research Foundation of Korea(NRF)
10.13039/501100003725
- Ministry of Science, ICT and Future Planning(MSIP)
10.13039/501100003621
2011-0019984, 2011-0030058, 2015R1D1A1A01059653
