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Microstructural Evolution and Recrystallization Behavior Traced by Electron Channeling Contrast Imaging
Applied Microscopy 2018;48:130-1
Published online December 28, 2018
© 2018 Korean Society of Microscopy.

Jin-Su Oh, and Cheol-Woong Yang*

School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon 16419, Korea
Correspondence to: *Correspondence to: Yang CW, http://orcid.org/0000-0003-0475-8399, Tel: +82-31-290-7362, Fax: +82-31-290-7371, E-mail: cwyang@skku.edu
Received December 25, 2018; Revised December 27, 2018; Accepted December 27, 2018.
This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted noncommercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
Abstract

Electron channeling contrast imaging (ECCI) is one of the imaging techniques in scanning electron microscopy based on a variation in electron backscattering yield depending on the direction of the primary electron beam with respect to the crystal lattice. The ECCI provides not only observation of the distribution of individual grains and grain boundaries but also identification of the defects such as dislocations, twins, and stacking faults. The ECCI at the interface between recrystallized and deformed region of shot peening treated nickel clearly demonstrates the microstructural evolution during the recrystallization including original grain boundaries, and thus can provide better insight into the recrystallization behavior.

Keywords : Electron channeling contrast imaging, Recrystallization, Shot peening, Original grain boundaries
References
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